SEM specimen holders
Labtech offers a full range of Micro to Nano SEM specimen holders for easier and quicker mounting of specimens directly in the SEM.
Increased spatial resolution both for imaging and analysis is achieved when specimens are secured correctly ensuring they do not move under the electron beam. The EM-Tec brand indicates products specifically developed and manufactured to the highest standard for Electron Microscopy using parts and materials that are vacuum compatible. Our SEM specimen holders exhibit no out-gassing or contamination issues.
There is a Micro to Nano holder for all applications in material, life, food, forensic sciences and in semiconductor using a variety of clamping jaws and securing screws and clips. EM-Tec SEM specimen holders with a M4 threaded hole are fully compatible with EM-Tec SEM stage adaptors offering many possibilities to adapt numerous specimen holders to all brands of SEM.
The range of Micro to Nano EM-Tec SEM specimen holders include:
Small stub-based holders
Versatile vice clamp holders
S-clip specimen holders
Fixed and variable tilt holders
Low Profile S-Clip SEM
Centering vice holders
EBSD and t-EBSD holders
t-EBSD grid holders
Spring-loaded vice holders
Compact vice holders
90 degree and off-set holders
Universal spring-loaded holders
Geological slide holders
Metallographic top reference holders
C-square multi pin stub holders
TEM grid holders
STEM imaging holder
FIB grid holders
Bulk specimen holders
Multi-pin stub holders
Metallographic mount holders
JEOL multi-stub holders
Hitachi multi-stub holders
JEOL Neoscope holders
Hitachi TM series holders
Phenom specimen holders
Small vice holders
Wafer holders
Multi XL holders large
Swivel-tilt holders
Filter disc holders for SEM / EDS analysis
SampleClamp SEM holders
Versa-Plate adaptable specimen holders
Multiple metallographic mounts
Four-sided clamping holders
Universal specimen holder kit
Smart-Clip metallographic mount holders
SEM stub adaptors:
Our wide range of SEM stub adaptors enable the use of one type of SEM specimen stub across different SEM platforms.
